To enhance the thermal stability of metal-semiconductor nanowire(NW)-metal (M-S-M) nanostructure under high electrical and thermal stress conditions, current-induced failure of ZnSe NWs in the M-S-M nanostructure is studied by in situ transmission electron microscopy. When the single NW is replaced by a bundle of NWs, the large current density flowing through the single NW protruding out of the bundle of NWs is responsible for the electrical breakdown of NWs. In this case, the failure mechanism of the NW changes from the bias polarity-dependent...
