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Analysis of a two-grid method for semiconductor device problem

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成果类型:
期刊论文
作者:
Liu, Ying;Chen, Yanping*;Huang, Yunqing;Li, Qingfeng
通讯作者:
Chen, Yanping
作者机构:
[Liu, Ying; Huang, Yunqing; Li, Qingfeng] Xiangtan Univ, Sch Math & Computat Sci, Hunan Key Lab Computat & Simulat Sci & Engn, Xiangtan 411105, Hunan, Peoples R China.
[Liu, Ying] Hunan Agr Univ, Coll Informat & Intelligence, Changsha 410128, Peoples R China.
[Chen, Yanping] South China Normal Univ, Sch Math Sci, Guangzhou 510631, Peoples R China.
通讯机构:
[Chen, Yanping] S
South China Normal Univ, Sch Math Sci, Guangzhou 510631, Peoples R China.
语种:
英文
关键词:
Galerkin method;Lq error estimate;mixed finite element method;O241.82;semiconductor device;two-grid method
期刊:
应用数学和力学:英文版
ISSN:
0253-4827
年:
2021
卷:
42
期:
1
页码:
143-158
基金类别:
Project supported by the State Key Program of National Natural Science Foundation of China(No. 11931003); the National Natural Science Foundation of China (Nos. 41974133, 11671157;11971410);
机构署名:
本校为其他机构
摘要:
The mathematical model of a semiconductor device is governed by a system of quasi-linear partial differential equations. The electric potential equation is approximated by a mixed finite element method, and the concentration equations are approximated by a standard Galerkin method. We estimate the error of the numerical solutions in the sense of the Lq norm. To linearize the full discrete scheme of the problem, we present an efficient two-grid method based on the idea of Newton iteration. The main procedures are to solve the small scaled nonlin...

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