ISIP: 2009 INTERNATIONAL SYMPOSIUM ON INFORMATION PROCESSING, PROCEEDINGS
年：
2009
页码：
346-351
机构署名：
本校为第一且通讯机构
院系归属：
信息科学技术学院
摘要：
correct detection of external defects on potatoes is the key technology in the realization of automatic potato grading and sorting station. This paper reports a novel inspection approach to external defects of potato in three potato cultivars. Adaptive Intensity Interception (AII) and Fixed Intensity Interception (FII) methods have been proposed to extract the suspect defects. Otsu segmentation combined with morphologic operation was used to remove the normal skin and background. Area threshold and black ratio threshold were used to identify defects in the suspect defects. Experiments have sho...
